by Chandler | Feb 19, 2015 | White Papers
Click the link below to view the full recording of our recent webinar: Improving Chip Reliability Through Synchronizer Optimization VIEW FULL RECORDING In this webinar a panel of experts will discuss the role of synchronizer design in modern chip development. Using...
by Chandler | Feb 15, 2015 | Published Articles
GET THE PUBLIC SYNCHRONIZER NOW You might ask yourself “Why would anyone want to have a public synchronizer available to download?” Usually designers just grab a flip-flop from his or her company’s or a standard cell vendor’s library. However, are these handy...
by Chandler | Feb 13, 2015 | Published Articles
S. Beer, R. Ginosar, J. Cox, T. Chaney, D. Zar “Metastability challenges for 65nm and beyond; simulation and measurements” Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 VIEW FULL ARTICLE S. Beer, R. Ginosar “Eleven ways to boost your...
by Chandler | Jan 26, 2015 | Published Articles
Measuring metastability is just 50 years old this year. In 1965 my colleague Tom Chaney took a sampling ‘scope picture of an ECL flip-flop going metastable. S. Lubkin had made mention of the phenomenon over a decade before that, but at that time most engineers were...
by Chandler | Jan 19, 2015 | Blendics News
Date & Time Wednesday, February 18, 2015 1:00PM to 2:00 PM CST VIEW FULL RECORDING Description In this webinar a panel of experts will discuss the role of synchronizer design in modern chip development. Using traditional approaches, in both design and...
