Improving Computer Scalability & Reliability to Enable Continued Technology Advancement

Webinar Recording: Improving Chip Reliability…

Click the link below to view the full recording of our recent webinar:  Improving Chip Reliability Through Synchronizer Optimization VIEW FULL RECORDING In this webinar a panel of experts will discuss the role of synchronizer design in modern chip development. Using...

A Public Synchronizer

GET THE PUBLIC SYNCHRONIZER NOW You might ask yourself “Why would anyone want to have a public synchronizer available to download?” Usually designers just grab a flip-flop from his or her company’s or a standard cell vendor’s library. However, are these handy...

Metastability References

S. Beer, R. Ginosar, J. Cox, T. Chaney, D. Zar “Metastability challenges for 65nm and beyond; simulation and measurements” Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 VIEW FULL ARTICLE S. Beer, R. Ginosar “Eleven ways to boost your...

Measuring Metastability

Measuring metastability is just 50 years old this year. In 1965 my colleague Tom Chaney took a sampling ‘scope picture of an ECL flip-flop going metastable. S. Lubkin had made mention of the phenomenon over a decade before that, but at that time most engineers were...